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电化学刻蚀参数对高阻厚壁宏孔硅阵列表面形貌的影响 |
安欢1,伍建春1,张仲1,王欢1,孙华2,展长勇1( ),邹宇1( ) |
1. 四川大学原子核科学技术研究所 辐射物理及技术教育部重点实验室 成都 610064 2. 苏州大学物理学院 苏州 215006 |
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Effect of Electrochemical Etching Parameters on Surface Morphology of Thick-walled Macroporous Silicon Array |
Huan AN1,Jianchun WU1,Zhong ZHANG1,Huan WANG1,Hua SUN2,Changyong ZHAN1( ),Yu ZOU1( ) |
1. Key Laboratory of Radiation Physics and Technology, Ministry of Education, Institute of Nuclear Science and Technology, Sichuan University, Chengdu 610064, China 2. College of Physics, Soochow University, Suzhou 215006, China |
引用本文:
安欢,伍建春,张仲,王欢,孙华,展长勇,邹宇. 电化学刻蚀参数对高阻厚壁宏孔硅阵列表面形貌的影响[J]. 材料研究学报, 2019, 33(3): 177-184.
Huan AN,
Jianchun WU,
Zhong ZHANG,
Huan WANG,
Hua SUN,
Changyong ZHAN,
Yu ZOU.
Effect of Electrochemical Etching Parameters on Surface Morphology of Thick-walled Macroporous Silicon Array[J]. Chinese Journal of Materials Research, 2019, 33(3): 177-184.
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