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HCl浓度对多孔硅微结构及Si-H键合的影响* |
安红章1,吴开均1,肖婷2,展长勇2,任丁1,2 |
1. 保密通信重点实验室 成都 610041 2. 辐射物理及技术教育部重点实验室 四川大学原子核科学技术研究所 成都 610064 |
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Effect of the Concentration of Hydrochloric Acid on the Microstructure and Si-H Bonds in Porous Silicon |
Hongzhang AN1,Kaijun WU1,Ting XIAO2,Changyong ZHAN2,Ding REN1,2,* |
1. Science and Technology on Communication Security Laboratory, Chengdu 610041, China 2. Key Laboratory of Radiation and Technology of Education Ministry of China, Institute of Nuclear Science and Technology, Sichuan University, Chengdu 610064, China |
引用本文:
安红章,吴开均,肖婷,展长勇,任丁. HCl浓度对多孔硅微结构及Si-H键合的影响*[J]. 材料研究学报, 2016, 30(9): 717-720.
Hongzhang AN,
Kaijun WU,
Ting XIAO,
Changyong ZHAN,
Ding REN.
Effect of the Concentration of Hydrochloric Acid on the Microstructure and Si-H Bonds in Porous Silicon[J]. Chinese Journal of Materials Research, 2016, 30(9): 717-720.
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