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材料研究学报  2015, Vol. 29 Issue (6): 475-480    DOI: 10.11901/1005.3093.2014.466
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脉冲频率对锆薄膜表面形貌和结构的影响
刘伟,张晓红,刘锦华,梁建华,龙兴贵()
中国工程物理研究院 核物理与化学研究所 绵阳 621900
Effect of Pulse Frequency on Surface Morphology and Microstructure of Zr Films Prepared by Pulse Laser Deposition
Wei LIU,Xiaohong ZHANG,Jinhua LIU,Jianhua LIANG,Xinggui LONG()
Institute of Nuclear Physics and Chemistry, CAEP, Mianyang 621900, China
引用本文:

刘伟,张晓红,刘锦华,梁建华,龙兴贵. 脉冲频率对锆薄膜表面形貌和结构的影响[J]. 材料研究学报, 2015, 29(6): 475-480.
Wei LIU, Xiaohong ZHANG, Jinhua LIU, Jianhua LIANG, Xinggui LONG. Effect of Pulse Frequency on Surface Morphology and Microstructure of Zr Films Prepared by Pulse Laser Deposition[J]. Chinese Journal of Materials Research, 2015, 29(6): 475-480.

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摘要: 

用脉冲激光气相沉积法在金属钼基底上制备锆薄膜, 并用SEM, AFM, XRD等手段分析薄膜表面形貌和晶体结构, 研究了脉冲激光频率对薄膜表面形貌和晶体结构的影响。结果表明: 随着激光脉冲频率的提高锆薄膜表面液滴数目增加, 液滴尺寸增大, 薄膜的沉积速率显著降低。薄膜表面的平均纳米颗粒尺寸, 随着频率的提高呈现先增大后减小的规律。从XRD数据发现, 较高的脉冲频率极大地促进了薄膜的结晶性生长; 但是, 频率变化对Zr薄膜晶体结构、晶面择优生长的影响并不明显, 薄膜呈现典型的hcp结构且不随频率的变化改变。

关键词 金属材料锆薄膜脉冲激光气相沉积液滴脉冲频率    
Abstract

Zr films have been successfully deposited on Mo substrate by pulsed laser deposition (PLD).The microstructure and morphology of the as-deposited films were examined by grazing-incidence X-ray diffraction (GIXRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The results show that the dimension and density of droplets increase with increasing pulse frequency. In the range of 6 to 20 Hz, the average deposition rate decreases with increasing pulse frequency. Under the same conditions, the average nanoparticle sizes of Zr films deposited on Mo increase and then decreases with increasing pulse frequency. Through XRD analysis, it follows that the higher pulse frequency is beneficial to the higher degree of crystallinity of Zr films. However, the pulse frequency has no significant effect on the preferential orientation of crystal planes of the deposited films.

Key wordsmetallic materials    zirconium thin film    pulsed laser deposition    droplet    pulse repetition rate
收稿日期: 2014-08-11     
作者简介: 龙兴贵, 研究员
图1  PLD制备Zr薄膜设备示意图
Wavelength/nm Substrate temperature/℃ Background Vacuum/Pa Distance from target to substrate/mm Pulse energy /mJ Pulse repetition rate/Hz Substrate
248 200 1×10-5 50 300 6,10 15, 20 Mo
表1  激光特点与实验参数
图2  薄膜表面的金属液滴EDS分析及不同脉冲频率沉积得到的Zr薄膜SEM像
图3  100个最大液滴平均尺寸随频率变化曲线图和平均沉积速率随频率变化曲线图
图4  Zr薄膜AFM平面图
图5  平均晶粒尺寸随频率变化曲线图
图6  Mo衬底上不同脉冲频率下制得锆薄膜XRD图
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