氦离子辐照对钨纳米丝稳定性的影响

doi:10.11901/1005.3093.2021.622

材料研究学报

2022, Vol. 36

Issue (11): 850-854 DOI: 10.11901/1005.3093.2021.622

研究论文

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氦离子辐照对钨纳米丝稳定性的影响

胡瑞航, 杨贞, 雷齐俊, 李昕洋, 董子宇, 张晓彤, 范红玉(

), 牛金海(

)

大连民族大学辽宁省等离子体技术重点实验室大连 116600

Effect of Helium Ions Irradiation on Stability of Nano-tungsten Whiskers

HU Ruihang, YANG Zhen, LEI Qijun, LI Xinyang, DONG Ziyu, ZHANG Xiaotong, FAN Hongyu(

), NIU Jinhai(

)

Liaoning Key Laboratory of Plasma Technology, Dalian Minzu University, Dalian 116600, China

引用本文:

胡瑞航, 杨贞, 雷齐俊, 李昕洋, 董子宇, 张晓彤, 范红玉, 牛金海. 氦离子辐照对钨纳米丝稳定性的影响[J]. 材料研究学报, 2022, 36(11): 850-854.
Ruihang HU, Zhen YANG, Qijun LEI, Xinyang LI, Ziyu DONG, Xiaotong ZHANG, Hongyu FAN, Jinhai NIU. Effect of Helium Ions Irradiation on Stability of Nano-tungsten Whiskers[J]. Chinese Journal of Materials Research, 2022, 36(11): 850-854.

全文: PDF(4235 KB) HTML

摘要:

用150 eV高能氦(He)离子在400 K对多晶钨(W)表面的W纳米丝进行间歇式辐照并使用扫描电子显微镜、透射电子显微镜以及称重法等手段对其表征，研究了He离子辐照对W纳米丝演变过程的影响。结果表明，高能He离子辐照使W纳米丝极不稳定。随着辐照剂量的增加W纳米丝之间的交联程度逐渐降低。W丝内的He泡在高能He离子溅射的作用下破裂，使W丝塌陷合并，部分溅射出来的W原子沉积在近邻的W纳米丝外壁或W丝根部，最终使W纳米丝演变成顶部细根部粗的锥型结构。

关键词 ：金属学, 钨, 氦离子辐照, 溅射

Abstract：

Nanoscale tungsten whiskers grown on the surface of polycrystalline W-plate was subjected intermittently to irradiation of He ions with energy of 150 eV at 400 K. The effect of He ion irradiation on the evolution of nanoscale W-whiskers were investigated by means of scanning electron microscope, transmission electron microscope and mass loss method. The results show that nanoscale W-whiskers were extremely unstable in the course of high-energy He ion irradiation, and the degree of crosslinking between W-whiskers decreases gradually with the increase of irradiation fluence. Due to high-energy He ion sputtering, He bubbles existed in the whiskers will break and lead to collapse and coalesce of the W-whiskers. Meanwhile, certain amount of the yielded W atoms by He ion sputtering may re-deposited on the outer wall or the root of the nanoscale whiskers nearby, and finally, the relevant nanoscale whiskers may evolve into a cone-shaped structure with a thin top and a thick root.

Key words： metallography tungsten He ions irradiation sputtering

收稿日期: 2021-11-04

ZTFLH:

TG14

基金资助:国家自然科学基金(11405023);辽宁省自然科学基金(20180510006);辽宁省大学生创新创业训练项目(202112026040);大连民族大学“太阳鸟”学生科研项目(tyn2021150)

作者简介: 胡瑞航，男，2001年生，本科生

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https://www.cjmr.org/CN/10.11901/1005.3093.2021.622 或 https://www.cjmr.org/CN/Y2022/V36/I11/850

图1 间歇式He离子辐照后W纳米丝表面的SEM照片

图2 间歇式He离子辐照后W纳米丝表面的高分辨SEM照片

图3 间歇式He离子辐照后W纳米丝截面的SEM照片和W丝层的厚度随辐照剂量的变化

图4 W丝样品的质量损失和溅射率与He离子辐照剂量的关系

图5 用不同剂量He离子辐照后W丝的透射电镜照片

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