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β-In2Se3 堆垛缺陷的电子显微学研究 |
王强1, 朱鹤雨2,3, 刘志博2,3( ), 朱毅2,3, 刘培涛2,3, 任文才2,3 |
1.沈阳化工大学材料科学与工程学院 沈阳 110142 2.中国科学院金属研究所 沈阳材料科学国家研究中心 沈阳 110016 3.中国科学技术大学材料科学与工程学院 沈阳 110016 |
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Electron Microscopy Study of Stacking Defects in β-In2Se3 |
WANG Qiang1, ZHU Heyu2,3, LIU Zhibo2,3( ), ZHU Yi2,3, LIU Peitao2,3, REN Wencai2,3 |
1.School of Materials Science and Engineering, Shenyang University of Chemical Technology, Shenyang 110142, China 2.Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China 3.School of Materials Science and Engineering, University of Science and Technology of China, Shenyang 110016, China |
引用本文:
王强, 朱鹤雨, 刘志博, 朱毅, 刘培涛, 任文才. β-In2Se3 堆垛缺陷的电子显微学研究[J]. 材料研究学报, 2024, 38(5): 330-336.
Qiang WANG,
Heyu ZHU,
Zhibo LIU,
Yi ZHU,
Peitao LIU,
Wencai REN.
Electron Microscopy Study of Stacking Defects in β-In2Se3[J]. Chinese Journal of Materials Research, 2024, 38(5): 330-336.
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