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EFFECT OF ANNEALLING ON STRUCTURE AND ELECTRONIC COMPOSITION OF OXYGEN SENSITIVE CeO_(2-x) FILMS |
DU Xinhua; LIU Zhedriang;XIE Kan;WANG Yanbin;CHU Wuyang(University of Science and Technology; Beijing 100083)( Institute of Physics; The Chinese Academy of Sciences; Beijing 100080) |
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Cite this article:
DU Xinhua; LIU Zhedriang;XIE Kan;WANG Yanbin;CHU Wuyang(University of Science and Technology; Beijing 100083)( Institute of Physics; The Chinese Academy of Sciences; Beijing 100080). EFFECT OF ANNEALLING ON STRUCTURE AND ELECTRONIC COMPOSITION OF OXYGEN SENSITIVE CeO_(2-x) FILMS. Chin J Mater Res, 1998, 12(6): 610-614.
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Abstract The CeO2-x films are deposited from a sintered CeO2-x ceramic target by reactive high frequency sputtering magnetron system. Influence of annealling process on the composition and Structure of CeO2-x films were determined by XRD, AFM and XPS. The results
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Received: 25 December 1998
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1F.Millot, P.De、MierrylJ PhyB Chem Solids. 46, 797(1985) 2M.Romeo,K.Bak,J.El.Fallah,F.Le.Normand,L Hilaire,Surf and interface anal.20,508(1993) 3P.Burroughs, A.Hammertl, Chem Soc Dation Thans. 1686(1976) 4A.PauflK.D.Schierbaum, Surf Set. 321, 71(1994) 5T.L.Bars,J Phys Chem. 82, 1801(1978) 6C.A.Strydom, H.J.Strydom, Inorg Chem Acta. 161, 7(1989) 7C.Hardacre, G.M.Roe, R.M.Lambert, Surf Sci. 326, 1(1995) 8E.Paparazzo。 Surf Sci Lett. 234, L253(1990) |
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