Measurement of Compressive Young’s Modulus of Polymer Particles Using Atomic Force Microscopy

doi:10.11901/1005.3093.2014.026

Chinese Journal of Materials Research

2014, Vol. 28

Issue (7): 509-514 DOI: 10.11901/1005.3093.2014.026

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Measurement of Compressive Young’s Modulus of Polymer Particles Using Atomic Force Microscopy

Yang CHEN^1,²,Cheng QIAN¹,Zhitang SONG^2,^3,^**(

),Guoquan MIN²

1. Department of Material Science and Engineering, Changzhou University, Changzhou 213164
2. Shanghai Nanotechnology Promotion Center, Shanghai 200237
3. Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050

Cite this article:

Yang CHEN,Cheng QIAN,Zhitang SONG,Guoquan MIN. Measurement of Compressive Young’s Modulus of Polymer Particles Using Atomic Force Microscopy. Chinese Journal of Materials Research, 2014, 28(7): 509-514.

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Abstract

The monodispersed polystyrene (PS) particles with the size of 200-500 nm were prepared via a soap-free emulsion polymerization method. The as-synthesized PS microspheres were immobilized on a rigid substrate surface through the attraction between the negative-charged silica and the positive-charged PS. The mechanical properties of the as-synthesized PS microspheres were measured by a Peak Force tapping atomic force microscope. The compressive Young’s moduli (E) of 2-3 GPa (Hertz’s model) and 2-6 GPa (Sneddon’s model) were calculated by the analysis of the force-displacement curves captured on the top of the PS particles. The moduli were slightly less than that of PS bulk materials, and the E values increased slowly with an increase of the size of the PS particles. In addition, the Hertz’s model might be more suitable to calculate the E of the obtained samples than the Sneddon’s model.

Key words: foundational discipline in materials science polystyrene microspheres atomic force microscope compressive Young’s modulus Hertz’s model Sneddon’s model

Received: 13 January 2014

Fund: *Supported by National Natural Science Foundation of China No. 51205032, the Natural Science Foundation of Jiangsu Province of China No. BK2012158, the Shanghai Municipal Natural Science Foundation No. 13ZR1436700 and China Postdoctoral Science Foundation No. 2013M541535.

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	Yang CHEN
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	Guoquan MIN

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Fig.1 Typical SEM images of PS colloid particle samples obtained with different PVP concentrations (a) blank, (b) 0.04 mmol/L, (c) 0.5mmol/L , (d) 0.8 mmol/L

Fig.2 Typical AFM images of PS₂₀₀ (a) and PS₃₅₀ (b) particles deposited on a substrate

Fig.3 Schematic drawing for the relative displacement and deformation of the particle-AFM tip-sample

Fig.4 Schematic drawing for the Hertz (a) and the Sneddon (b) contact model

Fig.5 Force-displacement curves and force-separation curves (inset) of PS₂₀₀ (a) and PS₂₅₀ (b) samples

Table1 Compressive Young's modulus for PS microsphere samples

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