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环氧树脂的飞行时间次级离子质谱仪(TOF—SIMS)分析 |
邓朝辉;陈维孝;宗祥福 |
复旦大学 |
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CHARACTERIZATION OF EPOXIDE RESINS BY TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS) |
DENG Zhaohui; CHEN Weixiao; ZONG Xiangfu (Fuden University) |
引用本文:
邓朝辉;陈维孝;宗祥福. 环氧树脂的飞行时间次级离子质谱仪(TOF—SIMS)分析[J]. 材料研究学报, 1995, 9(5): 457-462.
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CHARACTERIZATION OF EPOXIDE RESINS BY TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS)[J]. Chin J Mater Res, 1995, 9(5): 457-462.
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