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Chinese Journal of Materials Research  2022, Vol. 36 Issue (11): 850-854    DOI: 10.11901/1005.3093.2021.622
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Effect of Helium Ions Irradiation on Stability of Nano-tungsten Whiskers
HU Ruihang, YANG Zhen, LEI Qijun, LI Xinyang, DONG Ziyu, ZHANG Xiaotong, FAN Hongyu(), NIU Jinhai()
Liaoning Key Laboratory of Plasma Technology, Dalian Minzu University, Dalian 116600, China
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HU Ruihang, YANG Zhen, LEI Qijun, LI Xinyang, DONG Ziyu, ZHANG Xiaotong, FAN Hongyu, NIU Jinhai. Effect of Helium Ions Irradiation on Stability of Nano-tungsten Whiskers. Chinese Journal of Materials Research, 2022, 36(11): 850-854.

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Abstract  

Nanoscale tungsten whiskers grown on the surface of polycrystalline W-plate was subjected intermittently to irradiation of He ions with energy of 150 eV at 400 K. The effect of He ion irradiation on the evolution of nanoscale W-whiskers were investigated by means of scanning electron microscope, transmission electron microscope and mass loss method. The results show that nanoscale W-whiskers were extremely unstable in the course of high-energy He ion irradiation, and the degree of crosslinking between W-whiskers decreases gradually with the increase of irradiation fluence. Due to high-energy He ion sputtering, He bubbles existed in the whiskers will break and lead to collapse and coalesce of the W-whiskers. Meanwhile, certain amount of the yielded W atoms by He ion sputtering may re-deposited on the outer wall or the root of the nanoscale whiskers nearby, and finally, the relevant nanoscale whiskers may evolve into a cone-shaped structure with a thin top and a thick root.
Key words:  metallography      tungsten      He ions irradiation      sputtering     
Received:  04 November 2021     
ZTFLH:  TG14  
Fund: National Natural Science Foundation of China(11405023);Natural Science Foundation of Liaoning Province(20180510006);College Students Innovation Training Project of Liaoning Province(202112026040);“Taiyangniao” Student Research Project of Dalian Minzu University(tyn2021150)
About author:  NIU Jinhai, Tel: (0411)87924857, E-mail: niujh@ dlnu.edu.cn
FAN Hongyu, Tel: (0411)87924857, E-mail: fanhy@dlnu.edu.cn
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Ruihang HU
Zhen YANG
Qijun LEI
Xinyang LI
Ziyu DONG
Xiaotong ZHANG
Hongyu FAN
Jinhai NIU

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https://www.cjmr.org/EN/10.11901/1005.3093.2021.622     OR     https://www.cjmr.org/EN/Y2022/V36/I11/850

Fig.1  SEM analysis of the surface morphology of W fuzz irradiated by intermittent He ion with different fluence, magnification is 40 K (a) 0/m2, (b) 3.0×1023 /m2, (c) 1.2×1024 /m2, (d) 2.4×1024 /m2, (e) 3.6×1024 /m2, (f) 5.5×1024 /m2, (g) 7.5×1024 /m2, (h) 1.0×1025 /m2
Fig.2  High resolution SEM analysis of the surface morphology of W fuzz irradiated by intermittent He ion with different fluence, magnification is 150 K (a) 0/m2, (b) 3.0×1023 /m2, (c) 1.2×1024 /m2, (d) 2.4×1024 /m2, (e) 3.6×1024 /m2, (f) 5.5×1024 /m2, (g) 7.5×1024 /m2, (h) 1.0×1025 /m2
Fig.3  SEM analysis of the effect of intermittent He ion irradiation with different fluence on the cross-section morphology of W fuzz (a~d)and the curve of W fuzz layer thickness versus He+ fluence (e) (a) 0/m2, (b) 2.4×1024 /m2, (c) 5.5×1024 /m2, (d) 1.0×1025 /m2
Fig.4  Mass loss of W fuzz and sputtering yields of W sample as a function of H ion energy
Fig.5  TEM analysis the surface topography of W fuzz at different He ion fluence (a) 0/m2, (b) 1.2×1024 /m2, (c) 2.4×1024 /m2, (d) 3.6×1024 /m2, (e) 5.5×1024 /m2, (f) 1.0×1025 /m2
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