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MICROSTRUCTURE AND OPTICAL PROPERTIES OF THE AIN FILMS DEPOSITED BY ION BEAM ENHANCED REACTIVE MAGNETRON SPUTTERING |
WANG Hao;HUANG Rongfang;HONG Ruijiang;WU Jie;WEN Lishi(Institute of Metal Research;Academia Sinica) |
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Cite this article:
WANG Hao;HUANG Rongfang;HONG Ruijiang;WU Jie;WEN Lishi(Institute of Metal Research;Academia Sinica). MICROSTRUCTURE AND OPTICAL PROPERTIES OF THE AIN FILMS DEPOSITED BY ION BEAM ENHANCED REACTIVE MAGNETRON SPUTTERING. Chin J Mater Res, 1992, 6(3): 236-240.
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Abstract Microstructure,crystallography,electron structure and optical properties ofaluminum nitride film deposited by ion beam enhanced reactive magnetron sputtering were stu-died.The results show that the microstructure of the film is uniform and the grain size
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Received: 25 June 1992
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