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Chinese Journal of Materials Research  2014, Vol. 28 Issue (4): 314-320    DOI: 10.11901/1005.3093.2014.042
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Preparation and Thermal Stability of Large-sized TiAl/Ti3Al Micro-laminated Thin Sheets
Zaoyu SHEN,Guanghong HUANG,Limin HE(),Rende MU,Zhendong CHANG
Beijing Institute of Aeronautical Materials, Beijing 100095
Cite this article: 

Zaoyu SHEN,Guanghong HUANG,Limin HE,Rende MU,Zhendong CHANG. Preparation and Thermal Stability of Large-sized TiAl/Ti3Al Micro-laminated Thin Sheets. Chinese Journal of Materials Research, 2014, 28(4): 314-320.

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Abstract  

Large-sized TiAl/Ti3Al micro-laminated composite thin sheet with thickness of 0.1-10 mm was prepared by high-powerful electron beam physical vapor deposition technology in laboratory. The composition and microstructure of TiAl/Ti3Al were chacterized by XRD and SEM. The results indicated that the prepared material with visible lamellar structure was alternately composed of α2-Ti3Al and γ-TiAl phase and the mean grain size of TiAl was about 1-2 µm. The degradation process was also investigated by high temperature annealing at various temperatures for 3 h.

Key words:  composite materials      EB-PVD      microlaminate      microstructure      thermal stability     
Received:  17 January 2014     

URL: 

https://www.cjmr.org/EN/10.11901/1005.3093.2014.042     OR     https://www.cjmr.org/EN/Y2014/V28/I4/314

Fig.1  XRD spectra of (a) TiAl and (b) Ti3Al single layer sample
Fig.2  XRD spectra of the TiAl/Ti3Al micolaminated composites
Fig.3  Micrographs of surface and cross-section of TiAl/Ti3Al microlaminated composites by SEM. (a) sample surface, (b) sample cross-section
Fig.4  EDS analysis of Ti3Al/TiAl microlaminated sheet
Fig.5  XRD of TiAl/Ti3Al microlaminates get from different annealing temperature for 3 h
Fig.6  Cross-sectional microstructure of a TiAl/Ti3Al microlaminate annealed at different temperature for 3 h under vacuum.(a)untreated, (b) 450℃, (c) 575℃ , (d) 700℃, (e) 825℃, (f) 950℃
Fig.7  Schematic diagram of TiAl/Ti3Al microlaminates in cross section
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