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XPS STUDY OF THE COMPOSITION AND STRUCTURE OF KTN ELECTROOPTIC THIN FILMS FORMED BY SOL-GEL PROCESS |
LU Chaojing; WANG Shiming; KUANG Anxiang; HUANG Guiyu; WANG Longhai (Hubei University)WANG Dianfen(Wuhan University ofTechnology)(Department of Physics; Nanjing University; Nanjing 210008) |
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Cite this article:
LU Chaojing; WANG Shiming; KUANG Anxiang; HUANG Guiyu; WANG Longhai (Hubei University)WANG Dianfen(Wuhan University ofTechnology)(Department of Physics; Nanjing University; Nanjing 210008). XPS STUDY OF THE COMPOSITION AND STRUCTURE OF KTN ELECTROOPTIC THIN FILMS FORMED BY SOL-GEL PROCESS. Chin J Mater Res, 1995, 9(2): 158-162.
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Abstract Epitaxial KTN (x=0.35) eletrooptic thin films were formed on (100) SrTiO3 substrates by sol-gel process.In this peper, wide and narrow scans of XPS analyses were studied on the surface of KTN thin films before and after Ar+ SPuttering for 10min. The resul
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Received: 25 April 1995
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1OrlowskiR,BoatnerLA,KratigE.OPtCommun,1980;35(1):452BonnerWA,DearbronEF,VanUitertLG,AmCeramSocBull,1965;44(1):93DebelyPE,EunterPE,ArendH.AmCeramSocBull,1979;58(6):6064卢朝靖,王世敏,邝安样等.科学通报,1994:39(4):185包定华,邝安祥,王世敏等.科学通报,1992;37(16):14706卢朝靖,王世敏,邝安祥等.无机材料学报.1993;8(4):4657WagnerCDetal.HandbookofX-rayPhotoelectronSpectroscopy.Perkin-ElemerCorporationPhysicalElectronicsDivision.PrintedinU.S.A,19798刘世宏,王当憨,潘承璜.X射线光电子能谱分析,北京:科学出版社,1988:250 |
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