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材料研究学报  1997, Vol. 11 Issue (5): 511-514    
  研究论文 本期目录 | 过刊浏览 |
离子束增强沉积Si_3N_4/Si多层红外干涉滤波薄膜
江炳尧;张福民;孙义林;陈酉善;柳襄怀
中国科学院上海冶金研究所离子束开放研究实验室;中国科学院上海冶金研究所离子束开放研究实验室;中国科学院上海冶金研究所离子束开放研究实验室;中国科学院上海冶金研究所离子束开放研究实验室;中国科学院上海冶金研究所离子束开放研究实验室
INFRARED FILTER FABRICATION BY ION BEAM ASSISTED DEPOSITION OF Si_3N_4 / Si FILMS
JIANG Bingyao ;ZHANG Fumin; SUN Yilin; CHEN Youshan; LIU Xianghuai(Ion Beam Laboralory; Shanghai Institute of Metallurgy; CAS)
引用本文:

江炳尧;张福民;孙义林;陈酉善;柳襄怀. 离子束增强沉积Si_3N_4/Si多层红外干涉滤波薄膜[J]. 材料研究学报, 1997, 11(5): 511-514.
, , , , . INFRARED FILTER FABRICATION BY ION BEAM ASSISTED DEPOSITION OF Si_3N_4 / Si FILMS[J]. Chin J Mater Res, 1997, 11(5): 511-514.

全文: PDF(353 KB)  
摘要: 利用离子束增强沉积工艺,在硅基片上制备Si3N4/Si多层红外干涉滤波薄膜结果表明,N2+N的辅助轰击对于合成接近化学配比的Si3N4薄膜起了关键作用薄膜的折射率可达1.74~1.84实验测得的多层滤波薄膜的红外反射谱与理论值相当接近
关键词 红外干涉滤波膜离子束增强沉积    
Abstract:Infrared filter was fabricated by ion beam assisted deposition of Si3N4/ Si films on the Si substrate. The experiments found that the N2+N+ ion assisted bom-bardment is the key of synthesis Si3N4 films. Strong peaks were found in the infrared reflection s
Key wordsinfraed filter ion beam assisted deposition Correspondent JIANG Bingyao    Ion Beam Laboratory    Shanghai Institute of Matellurgy    CAS    Shanghai 200050
收稿日期: 1997-10-25     
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