BNZ组分对KNN基无铅压电陶瓷结构和性能的影响
Effect of BNZ Component on Structure and Property of KNN Based Lead-free Piezoelectric Ceramics
通讯作者: 高大强,教授,gaodq@lzu.edu.cn,研究方向为压电陶瓷、二维磁性材料及电催化
责任编辑: 吴岩
收稿日期: 2022-12-07 修回日期: 2023-03-07
基金资助: |
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Corresponding authors: GAO Daqiang, Tel:
Received: 2022-12-07 Revised: 2023-03-07
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作者简介 About authors
李博森,男,1998年生,硕士生
制备铌酸钾钠-锆酸铋钠(1-x)K0.48Na0.52Nb0.96Sb0.04O3-x(Bi0.5Na0.5)ZrO3二元系无铅压电陶瓷并表征其结构和性能,研究了BNZ组分对其结构和性能的影响。结果表明,这种系列压电陶瓷具有典型的钙钛矿结构。x =0.04的这种陶瓷最为致密,其相对密度为97.43%;压电性能最优:d33 = 463 pC/N、kp = 0.55、Qm = 37。这种陶瓷材料在室温下处于三方-四方(R-T)两相共存状态并具有纳米畴结构,使其压电性能优异。
关键词:
In order to promote the practical application of lead-free piezoelectric ceramics, in this paper, a kind of sodium potassium niobate-sodium bismuth zirconate (1-x)K0.48Na0.52Nb0.96Sb0.04O3-x(Bi0.5Na0.5)ZrO3 lead-free piezoelectric ceramics were prepared, and their crystallographic structure and performance were assessed. Results show that their relative dielectric constant and the resonant frequency temperature are stable (< 10‰) with the variation of temperature; the piezoelectric ceramics are typical perovskite structure, and the most compact ceramic sample is obtained with x=0.04, which endows RD=97.43%, d33 = 463 pC/N, kp = 0.55 and Qm = 37; the piezoelectric ceramics consists of tripartite-tetragonal (R-T) two-phases and the existence of nanodomain structure may be the cause for the excellent piezoelectric properties of ceramic materials.
Keywords:
本文引用格式
李博森, 廖忠新, 高大强.
LI Bosen, LIAO Zhongxin, GAO Daqiang.
压电陶瓷是一类重要的功能材料,可将电能与机械能相互转换[1,2]。锆钛酸铅(PZT)基压电陶瓷具有优异的压电性能,但是其中的铅危害环境和人体健康[3]。铌酸钾钠(KNN)基无铅压电陶瓷具有良好的压电性能且环境友好,受到了极大的关注。但是,纯相铌酸钾钠陶瓷的居里温度Tc = 415℃,压电性能参数为d33 = 125 pC/N,kp = 0.40[4],表明其性能远不如PZT陶瓷。2004年日本Y.Satio用反应模板定向生长法(TGG)制备的正交-四方(O-T)两相共存的锂钽锑共掺杂KNN基织构陶瓷,其压电常数d33为416 pC/N,机电耦合系数kp达到0.61[5],可与商业PZT媲美。翟继卫等用TGG法制备了组分为0.96(K, Na)(Nb, Sb)O3-0.01CaZrO3-0.03(Bi, K)HfO3的织构陶瓷,其压电常数达到了惊人的700 pC/N[6]。可用Li+部分代替A位的Na+/K+,或者用Sb5+代替B位的Nb5+以使O-T相变移动至室温,得到极高的d33[7,8]。将(Bi, Na)ZrO3或(Bi, Na)HfO3等ABO3型氧化物掺入(K, Na)NbO3或(K, Na)(Nb, Sb)O3中,可使其O-T相变点下移或R-O相变点上移[9~15],进而压缩O相温度区间使其在室温发生R-T相变[15~18],提高陶瓷的d33[16~24]。
1 实验方法
1.1 样品的制备
用固相法制备KNN基陶瓷 (1-x)K0.48Na0.52Nb0.96Sb0.04O3-x(Bi0.5Na0.5)ZrO3陶瓷(简称为 KNNS-xBNZ),其中x = 0、0.02、0.03、0.04、0.05、0.06。使用的原料有K2CO3(纯度99.0%)、Na2CO3(纯度99.8%)、Nb2O5(纯度99.5%)、Sb2O3(纯度99.99%)、ZrO2(纯度99%)以及Bi2O3(纯度99.999%)。
先将K2CO3和Na2CO3置于200℃烘箱中去除水分,再按照化化学计量比称量原料。将称好的原料置于球磨罐中,以无水乙醇为介质用行星式球磨机(QM-3SP2)球磨15 h。将球磨好的原料取出烘干过筛,然后置于坩埚中进行合成。陶瓷的合成温度为900℃,保温时间为6 h;将合成后陶瓷粉二次球磨15 h,然后将其烘干过筛并加入3%的聚乙烯醇PVA粘结剂进行造粒。使用钢模具在8 MPa的压力下将粉料压成直径为10 mm、厚度为1 mm的圆片。在650℃排胶2 h后将陶瓷片置于高温炉中进行烧结。用两步法烧结:先以15℃/min的速率升温至1200~1220℃,保温5 min后迅速降温到1090~1120℃,保温20 h后自然降温,在制备出陶瓷片样品。将陶瓷片两面涂银后在780℃保温30 min进行烧银。然后在室温下进行极化,极化电场为3 kV/mm,静置24 h后测试电学性能。
1.2 性能表征
用阿基米德排水法测量陶瓷的实际密度ρ,其致密度为ρ/ρ0,而
为理论密度。其中m为样品相的数量,M为相对分子质量;V为晶胞体积;NA为阿伏伽德罗常数;n为单胞分子数;F为相体积比例。
用X'pert pro型X射线衍射仪(XRD)分析陶瓷的相结构,测试条件为:Cu靶Kα射线,电压为40 kV,电流为0.40 mA,扫描范围为20°~70°,测试步长为0.0167°,扫描速度为10 (°)/min。用LabRAM HR Evolution型超低波数拉曼光谱测试仪测试样品的拉曼光谱,入射光波长λ = 532 nm。用Hitachi S-4800型扫描电子显微镜(SEM)观测陶瓷表面和断面形貌。用Tecnai G2 F30,FEI型透射电子显微镜(TEM)测试陶瓷的内部微区结构。用ZJ-6A9型d33测试仪测量压电常数。用PV520A型阻抗分析仪测试平面机电耦合系数、机械品质因数。用Radiant PremierⅡ型铁电测试仪测量室温电滞回线,测试频率1 Hz,测试电场30 kV/cm。用TZDM型介电温谱测试系统测试陶瓷介电常数随温度的变化,测试频率10 kHz,升温速率3℃/min。串联谐振频率Fs的温度稳定性用频率温度变化率
表征。其中,TFs为串联谐振频率Fs的温度系数(单位为℃-1),Fs为串联谐振频率(单位为Hz),
2 结果和讨论
2.1 无铅压电陶瓷的形貌和结构
图1给出了不同组分的铌酸钾钠-锆酸铋钠体系无铅压电陶瓷的SEM形貌和晶粒尺寸分布。从图1a~f可见,随着BNZ组分含量的提高晶粒长大,尺寸分布更均匀,陶瓷表面趋向于致密化。x = 0.04的陶瓷中出现个别较大的晶粒,说明晶粒发生了异常长大,晶粒的平均尺寸为2.216 µm,达到最大值,如图1l所示。密度测试结果表明,x = 0.04陶瓷样品的相对密度最大,高达97.43%。这表明,0.04BNZ样品最为致密。从图1g、h也可见,0.04BNZ样品的截面紧密,气孔较少,致密度高。x >大于0.04的陶瓷,其晶粒的平均尺寸逐渐减小,相对密度逐渐降低,致密度逐渐变差。BNZ的含量,影响陶瓷内部晶粒的尺寸和致密度。一定程度的BNZ掺杂可使陶瓷的晶粒逐步变大且分布更加均匀,使致密度提高。这有利于消除自发极化产生的内应力,极化时有助于畴壁偏转,进而提高其压电性能。详细的压电性能参数在图2中给出。经过两步烧结后的未掺杂BNZ组分的KNN陶瓷,虽然其晶粒尺寸较大但是相对密度较低即致密度较低,不利于其压电性能的提高。
图1
图1
不同BNZ含量的铌酸钾钠-锆酸铋钠无铅压电陶瓷的SEM形貌和晶粒尺寸分布以及平均粒径尺寸
Fig.1
SEM and grain size distribution of potassium sodium niobate-bismuth sodium zirconate lead-free piezoelectric ceramics with different BNZ contents (a~f) SEM images of the surface; (g, h) x = 0.04 section SEM; (i~n) size distribution
图2
由图2d可见,x = 0.04的陶瓷其相对密度取最大值。随着x的增大样品的相对密度呈现先增大后减小的趋势,与SEM测试结果相吻合。压电测试结果表明,x = 0.04陶瓷的压电常数为463 pC/N,达到本体系的最大值,且其压电性能和居里温度是同类型无铅压电陶瓷中较高的;综合性能良好,如图2e所示。平面机电耦合系数kp反映薄片沿径向伸缩振动时机械能与电能之间的耦合参数,与剩余极化强度Pr相关。Pr越大则其kp也越大。随着BNZ含量的提高kp呈现先增大后减小趋势,在x = 0.03取最大值0.59。但是,压电常数的大小还与介电常数有关。机械品质因数Qm是指压电振子谐振时克服内摩擦消耗的能量。本文制备的陶瓷其Qm与极化程度和畴壁的运动有关。极化程度较高,Qm也较大。但是,文献[37]认为,畴壁的运动使Qm降低。当x在0~0.04范围变化时,随着BNZ含量的提高畴翻转与畴壁运动更加灵活,极化时电畴更加容易翻转达到饱和状态,因此Qm降低。畴壁运动对Qm的影响是主要的,也说明为何x = 0.04时d33取最大值。而BNZ含量大于0.04的样品中缺陷增加,大量空间电荷因钉扎而束缚电畴的运动[38],使Qm升高。同时,相共存度的降低也使畴难以反转,使d33下降和Qm升高。
2.2 陶瓷的相结构
图3给出了样品的室温XRD谱。从图3a可见,不同含量BNZ体系的压电陶瓷与纯相铌酸钾钠陶瓷的衍射峰相同,表明都是典型的钙钛矿结构,没有杂相。随着BNZ含量的提高,x = 0.02和0.03的陶瓷在室温下处于O-T相共存状态,T相的比例随着BNZ含量的提高而增大;x = 0.04和0.05的陶瓷在室温下R-T相共存;x = 0.02~0.05的样品均处于两相共存状态,表明本文制备的样品具有多型相界。图3b给出了
图3
图3
不同x的铌酸钾钠-锆酸铋钠无铅压电陶瓷的室温XRD谱、精修和相比例分布
Fig.3
XRD and Rietveld refinement pattern at room temperature of KNN-xBNZ ceramics (a) XRD spectrum; (b) locally amplified XRD pattern of 2θ = 32°; (c~h) Rietveld refinement pattern for x = 0~0.06; (i) phase proportion distribution of x = 0~0.06
为了进一步确定两相共存陶瓷样品的相结构和晶胞参数,使用GSAS软件对x = 0~0.06样品进行Rietveld精修,得到了精修图谱以及各相占比和对应的晶胞参数,如图3c~h和表1所示。可以看出,参与精修的所有样品其计算曲线与测试曲线吻合较好,Rwp均小于15%,说明精修的结果可靠。由图3i可见,随着BNZ组分的增加,x = 0.02~0.05的样品中T相的占比逐渐升高,x = 0.05的陶瓷T相的占比最大,为96.6%。BNZ组分达到0.04时由O-T相共存转变为R-T相共存,表明BNZ的引入降低了O-T相变温度和提高了R-O相变温度。这一结果与XRD谱和介温结果吻合。表1中的晶格常数表明,BNZ的持续掺杂使氧八面体扭曲,T相发生轻微的晶格畸变,x = 0.04时c/a达到最大。晶胞的c/a比值大,则可贡献的电偶极矩较高,陶瓷的压电性能最好[39]。x =0.06的陶瓷其畴的长程有序性遭到破坏,在2θ =45.5°只有一个衍射峰,表明出现了伪立方相,使压电性能急剧降低[10,40]。
表1 x = 0~0.06陶瓷样品的晶胞参数以及T相的c/a值
Table 1
x | 0 | 0.02 | 0.03 | 0.04 | 0.05 | 0.06 | ||||
---|---|---|---|---|---|---|---|---|---|---|
Phase | O | O | T | O | T | R | T | R | T | C |
Ratio/% | 100 | 80.28 | 19.72 | 62.28 | 37.72 | 15.81 | 84.19 | 3.4 | 96.6 | 100 |
a/nm | 0.3935 | 0.3961 | 0.3979 | 0.3965 | 0.3972 | 0.3965 | 0.3971 | 0.3988 | 0.3974 | 0.3978 |
b/nm | 0.5630 | 0.5641 | 0.3979 | 0.5639 | 0.3972 | 0.3965 | 0.3971 | 0.3988 | 0.3974 | 0.3978 |
c/nm | 0.5654 | 0.5652 | 0.3999 | 0.5646 | 0.4002 | 0.3965 | 0.4002 | 0.3988 | 0.4000 | 0.3991 |
c/a | - | - | 1.0050 | - | 1.0076 | - | 1.0078 | - | 1.0065 |
图4a给出了不同BNZ组分掺杂样品的拉曼谱。所有样品NbO6八面体的振动标记为1A1g(ν1) + 1Eg(ν2) + 2F1u(ν3, ν4) + F2g(ν5) + F2u(ν6)[41],其中ν1和ν2拉曼位移分别为对称和反对称拉伸模式,ν5拉曼位移为弯曲模式。由图4b可见,x为0~0.03时ν1减小,表明Nb-O距离增大使结合强度降低[42];x为0.03~0.06时ν1增大,Nb-O距离缩短。ν5拉曼位移也发生了不同的变化,x为0.02~0.05时ν5逐渐变小,当x为0.05~0.06时ν5变大,表明BNZ部分掺杂使铌氧八面体在(002)面内弯曲。ν1和ν5的不连续变化表明,随着BNZ掺杂量的增加,x = 0.02和0.03的陶瓷在室温下处于O-T共存状态,x = 0.04和0.05的瓷在室温下处于R-T共存状态。当x为0.03~0.04时ν2变小,表明适量的BNZ掺杂可使部分Nb-O沿[001]方向伸长,晶格发生变形。x为0.03~0.05时ν1 + ν5与ν1的变化一致,以晶格压缩为主,(002)面内弯曲为次。图4c表明,x = 0.04的ν1和ν2几乎合并成一个峰值。将x = 0.04陶瓷的ν1和ν2进行曲线拟合,结果如图3d所示。可以看出,BNZ掺杂引起(110)晶面向内变形和c缩短,因此陶瓷形成R-T两相共存[43]。这一结果与XRD谱的拟合结果吻合。
图4
图4
KNNS-xBNZ陶瓷的室温拉曼光谱、各振动模式的拉曼位移、x = 0.04陶瓷的拉曼谱以及x = 0.04陶瓷的ν1和ν2振动模式的拟合线
Fig.4
Raman spectra of KNNS-xBNZ ceramics at room temperature (a); variation of Raman displacement for each vibration mode (b); x = 0.04 ceramic Raman spectra (c) and fitting lines of vibration modes ν1 and ν2 of ceramics with x = 0.04 (d)
2.3 陶瓷的介电温谱
为了研究样品介电性能与相结构的关系,图5给出了不同x的陶瓷样品的介电温谱。图5a、d给出了极化前后介电常数在温度为-150~200℃的变化曲线。从图5a可见,两个相变峰分别从左到右对应R-O、O-T相变。x = 0.04的陶瓷其TR-O和TO-T发生了交叠,构成了TR-T。图5c表明,x = 0.04的陶瓷样品在室温下处于三方-四方(R-T)相共存的状态,极大地提高了陶瓷的压电性能[23,24]。极化使陶瓷样品的介温相变峰变得更加尖锐,极化使晶格发生畸变而导致R-T相共存转变为O-T相共存,如图5d、f所示。这证实了,本文成功地制备出在室温下R-T相共存的陶瓷样品。从图5b、e可见,在x从0逐渐增加至0.05的过程中四方-立方相变点Tc较高,均高于200℃,表明陶瓷样品具有较高的居里温度。其中性能最好的x = 0.04样品的居里温度Tc = 257℃,表明其具有较好的压电性能(d33 = 463 pC/N,kp = 0.55,Qm = 37)且居里温度也比较高。
图5
图5
极化前后不同x的二组分陶瓷的低温区介电温谱、高温区介电温谱以及相变温度变化
Fig.5
Dielectric temperature spectra of ceramics with different x (a, b, d, e); phase transition temperature variations of ceramics with different x (c, f)
2.4 陶瓷的铁电性能
图6a给出了不同x样品的室温电滞回线。可以看出,所有的样品均具有饱和的P-E回线。从图6b可见,随着BNZ掺杂的增加矫顽场Ec逐渐降低,说明BNZ的引入是一个降低能量势垒的过程,属于软性掺杂。软性掺杂使陶瓷的畴壁较易运动,使Qm减少和矫顽场降低,极化更容易进行[44]。同时,Pr先增大后减小在x = 0.03达到最大,与kp的变化规律一致。可根据唯象理论式d33 = 2Q33εrPr表示压电常数d33与相对介电常数
图6
图6
不同x陶瓷样品电滞回线全图、Ec、Pmax、Pr随x的变化、d33和εrPr随x的变化以及x = 0.04的陶瓷在-40~100oC以20oC作为对比的相对介电常数εr和串联谐振频率Fs的温度变化率随温度的变化
Fig.6
Full picture of electric hysteresis loop of ceramic samples under different x (a); changes of Ec, Pmax, Pr with x (b); the variation of d33 and εrPr with x (c); relative permittivity εr and series resonant frequency Fs temperature coefficient of ceramics with x = 0.04 at -40~100oC and 20oC as the contrast diagram with temperature (d)
2.5 陶瓷的温度稳定性
实验中测试了x = 0.04陶瓷样品的温度稳定性。目前对温度稳定性研究重点是压电常数、电致伸缩系数。而关于KNN基压电陶瓷的实际应用如换能器的串联谐振频率Fs、相对介电常数εr的温度稳定性,报道较少。串联谐振频率Fs是描述压电器件稳定的能量交换的重要指标之一,对于实际应用有重要的意义。而相对介电常数εr表征电介质储存静电荷的能力,对于实际应用也十分重要。因此,图6d给出了x = 0.04的陶瓷在-40~100℃以20℃作为对比的相对介电常数εr和串联谐振频率Fs的温度变化率与温度的关系。可以看出,TFs在-40~100℃低于3‰。
2.6 陶瓷的纳米畴结构
图7a、b给出了x = 0.04陶瓷样品透射电镜形貌,可见明显的纳米畴结构,其宽度约为10 nm。在x = 0.04陶瓷样品的SEM形貌中也发现了类似的纳米畴结构(图7c),其宽度约为200 nm。这与文献[50~53]报道的结果相似,说明x = 0.04陶瓷样品中也有纳米畴。研究表明,陶瓷的压电性能包括本征贡献和非本征贡献。本征贡献指多相共存和晶格畸变促进了极化翻转,提高了压电性能;而非本征贡献,指晶粒尺寸的畴壁运动以及极性纳米区对压电性能影响[54]。Xu等[18]用透射电镜在三方相(R)和四方相(T)共存区域观测到了纳米畴结构,还用压电力显微镜观测到电畴的应力信号,在电畴边界应力信号十分明显。这些高密度纳米畴,对提高陶瓷的压电性能有重要的作用。电畴越小其畴壁能量势垒越低,极化时更有利于电畴翻转,使陶瓷的压电常数增大。由此可见,KNN基压电陶瓷性能的提高包括本征贡献和非本征贡献。
图7
图7
x = 0.04的陶瓷样品的TEM和SEM形貌
Fig.7
TEM of ceramic sample with x = 0.04 (a, b) and SEM of ceramic sample with x = 0.04 (c)
3 结论
(1) 用固相法制备的铌酸钾钠-锆酸铋钠二元系无铅压电陶瓷没有杂相,为典型的钙钛矿结构。锆酸铋钠组分为0.04的样品最为致密,气孔量最小,晶粒尺寸均匀分布,压电性能优异。
(2) x = 0.04样品在室温的R-T两相共存状态以及陶瓷样品中的纳米畴结构,使其具有优异的压电性能。
(3) x = 0.04的陶瓷样品的相对介电常数
参考文献
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[J].
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