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Chin J Mater Res  1997, Vol. 11 Issue (3): 259-266    DOI:
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FRICTION FORCE MICROSCOPY AND MICRO-FRICTION CHARACTER OF SOME MATERIALS
LU Xinchun; WANG Jihui; DAI Changchun; WEN Shizhu; D. Konno (State Key Lab. of Tribology; Tsinghua University; Institute of Chemistry; Chinese Academy of Sci ences; Seiko Instruments Inc.; Japen)
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LU Xinchun; WANG Jihui; DAI Changchun; WEN Shizhu; D. Konno (State Key Lab. of Tribology; Tsinghua University; Institute of Chemistry; Chinese Academy of Sci ences; Seiko Instruments Inc.; Japen). FRICTION FORCE MICROSCOPY AND MICRO-FRICTION CHARACTER OF SOME MATERIALS. Chin J Mater Res, 1997, 11(3): 259-266.

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Abstract  A friction force microscope(FFM), which was modified from atomic force microscope(AFM),is introduced in this report. The FFM could be used to collect signal of vertical and lateral force in the same time, to show micro-force function, such as dependence o
Key words:  friction force moicroscope(FFM) nanotribology micro-friction behavior     
Received:  25 June 1997     
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