A METHOD FOR QUANTITATIVE TEXTURE ANALYSIS OF THIN-FILM AND COATING MATERIALS

Chin J Mater Res

1996, Vol. 10

Issue (5): 467-471 DOI:

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A METHOD FOR QUANTITATIVE TEXTURE ANALYSIS OF THIN-FILM AND COATING MATERIALS

WANG Yandong;LIU Yandong;XU Jiazhen(Northeastern University)

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WANG Yandong;LIU Yandong;XU Jiazhen(Northeastern University). A METHOD FOR QUANTITATIVE TEXTURE ANALYSIS OF THIN-FILM AND COATING MATERIALS. Chin J Mater Res, 1996, 10(5): 467-471.

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Abstract The texture analysis in thin films and coating materials has suffered some difficulty due to the broadenling diffraction peaks, strong defocusing effect and severe stochastic errors of measured pole figures.Based on the prirciple of maximum entropy and th

Key words: thin-film and coating material;quantitative texture analysis;the principle of maximum Entropy

Received: 25 October 1996

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https://www.cjmr.org/EN/ OR https://www.cjmr.org/EN/Y1996/V10/I5/467

1王沿东,徐家桢,金属学报,1995,31:B5502HeizmannJJ,LaruelleC,JApplCryst,1986,19:4673ChateignerD,GermiP,Pernet,MaterialsScienceForum,1994,157~162:13794ChateignerDetal．JApplCryst,1992,25:7665BermigG,TobischJ,HelmingK．MaterialsScienceForum,1994,157~162:976WangF,XuJZ,LiangZD．Warrendale,8thICOTOM,1987:1107LiangZD,XuJZ,WangF．TextruesandMicrostructures,1989,10:2178WenkJR,BurgeHJetal．TheEighthInternationalConferenceonTexturesofMaterials(ICOTOM8),1987:179王沿东,刘沿东,徐家桢．待发表

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