TEMPERATURE VARIATION AND MEASUREMENTS DURING ACRT PROCESS

Chin J Mater Res

1994, Vol. 8

Issue (3): 223-226 DOI:

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TEMPERATURE VARIATION AND MEASUREMENTS DURING ACRT PROCESS

LIU Shan; HUI Zengzhe; ZHOU Yaohe; LU Deyang(Northwestern Polytechnical University)

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LIU Shan; HUI Zengzhe; ZHOU Yaohe; LU Deyang(Northwestern Polytechnical University). TEMPERATURE VARIATION AND MEASUREMENTS DURING ACRT PROCESS. Chin J Mater Res, 1994, 8(3): 223-226.

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Abstract ACRT (Accelerated Crucible Rotation Technique) is a newly developed functional crystal growth technique and has been successfully employed to grow some functional crystals of superior quality, such as antiferromagnetic semiconductor MuTe, IR crystal CMT,

Key words: ACRT temperature field forced melt flow

Received: 25 June 1994

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https://www.cjmr.org/EN/ OR https://www.cjmr.org/EN/Y1994/V8/I3/223

1ScheelHJ．JCrystalGrowth,1972;13//14:5602PhBuffat,GaniercJD,RappazM,RytzD．JCystalGrowth．1986;74:3533ScheelHJ,SommerauerJJ．CrystalGrowth,1983;62:2914MateikaDJ．CrystalGrowth,1972:13//14:6985CapperP,GaleIG,GraingerF,RobertsJA．JCrystalGrowth,1988;92;16Schulz-DuBois．JCrystalGrowth,1972;12:877毛协民．西北工业大学硕士论文,1982．

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