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Chin J Mater Res  1994, Vol. 8 Issue (2): 155-157    DOI:
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ANNEALING PROPERTIES AND MICROSTRUCTURE OFLOW VOLTAGE ZnO-Bi_2O_3-TiO_2 VARISTORS
KANG Xueya;ZHUANG Shunchang(Xinjiang Institule of physics; Chipese Academy of Sciences)
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KANG Xueya;ZHUANG Shunchang(Xinjiang Institule of physics; Chipese Academy of Sciences). ANNEALING PROPERTIES AND MICROSTRUCTURE OFLOW VOLTAGE ZnO-Bi_2O_3-TiO_2 VARISTORS. Chin J Mater Res, 1994, 8(2): 155-157.

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Abstract  By using XRD and SEM the phase structure, microstructure and electrical properties ofZnO-Bi2O3-TiO2 system were studied at different annealing temperatures. It is found that the varistor becomes stable at annealing temperafure less than 500℃. The breakdow
Key words:  annealing properties;microstructure;low voltage ZnO varistors     
Received:  25 April 1994     
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