Chin J Mater Res  1991, Vol. 5 Issue (5): 404-407    DOI:

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MICROSTRUCTURE CHARACTERISTICS OF LASER ZONE REMELTING Bi SYSTEM SUPERCONDUCTING COMPOSITE TAPE

GE Yunlong LIU Qingmin JIN Hua LIU Chuausheng HU Zhuangqi (Instiute of Metal Research;Academia Sinica)

GE Yunlong LIU Qingmin JIN Hua LIU Chuausheng HU Zhuangqi (Instiute of Metal Research;Academia Sinica). MICROSTRUCTURE CHARACTERISTICS OF LASER ZONE REMELTING Bi SYSTEM SUPERCONDUCTING COMPOSITE TAPE. Chin J Mater Res, 1991, 5(5): 404-407.

Abstract References Related Articles Recommended Metrics Download:  PDF(979KB)  Export:  BibTeX | EndNote (RIS)       Abstract  On the surface of Ag tape with about microns thickness superconductingflim was coated by a nonequlibrium solidification process and treated by laser zone meltingmethod.The flexible superconducting composite tape with dense structure better bindingcharater Key words:  laser zone remelting      thick film      textured composite tape      Received:  25 October 1991      Service E-mail this article Add to citation manager E-mail Alert RSS （） Articles by authors URL:  https://www.cjmr.org/EN/     OR     https://www.cjmr.org/EN/Y1991/V5/I5/404 1 Emoto T,Yamamoto J,Muyakami Y et al.Jpn J Appl Phys,1990;29:923 2 Onishi M,Kohgo T,Chigusa Y et al.Jpn J Appl Phys,1990;29:64 3 Spann J R,Toth L E,Lloyd I K et al.J Mater Res,1990;(5) :1163 4 Kase J.Irisawa N,Morimoto T et al.Appl Phys Lett,1990;56:970 5 葛云龙,胡壮麒,乔桂文,李依依.物理,1989;(3) :158 6 葛云龙,胡壮麒.材料导报,1989;(12) :29 7 Gazit D,Feigelson R S.J Crystal Growth,1989;91:318 [1] . Infrared detector array with PLZT thick films on silicon--based microstructure tunnels[J]. 材料研究学报, 2004, 18(3): 310-314. No Suggested Reading articles found! Viewed Full text Abstract Cited   Shared      Discussed