APPLICATIONS OF X-RAY DOUBLE CRYSTAL DIFFRACTION TO INVESTGATION OF NEW MATERIALS

Chin J Mater Res

1991, Vol. 5

Issue (2): 129-133 DOI:

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APPLICATIONS OF X-RAY DOUBLE CRYSTAL DIFFRACTION TO INVESTGATION OF NEW MATERIALS

ZHU Nanchang LI Runshen CHEN Jingyi (Shanghai Institute of Metallurgy;Academia Sinica)

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ZHU Nanchang LI Runshen CHEN Jingyi (Shanghai Institute of Metallurgy;Academia Sinica). APPLICATIONS OF X-RAY DOUBLE CRYSTAL DIFFRACTION TO INVESTGATION OF NEW MATERIALS. Chin J Mater Res, 1991, 5(2): 129-133.

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Abstract The fundamental theory of X-ray double-crystal diffractometry is pres-ented in this paper.The applications of this technique to investigation or new structuralmaterials,which include ion implantation into semiconductor materials,single or multipleepitaxia

Key words: ion implantation X-ray double-crystal diffraction computer simulation

Received: 25 April 1991

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