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| STRUCTURE AND BOND CHARACTERIZATION OF THE NANOMETER-SIZED AMORPHOUS SILICON NITRIDE SOLID |
| ZHANG Lide;WANG Tao;CAI Shuzhi(Institute of Solid State Physics;Academia Sinica)MOU Jimei(University of Science and Technology of China) |
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Cite this article:
ZHANG Lide;WANG Tao;CAI Shuzhi(Institute of Solid State Physics;Academia Sinica)MOU Jimei(University of Science and Technology of China). STRUCTURE AND BOND CHARACTERIZATION OF THE NANOMETER-SIZED AMORPHOUS SILICON NITRIDE SOLID. Chin J Mater Res, 1992, 6(6): 523-527.
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Abstract The nanometer-sized silicon nitride solids(NANO-SNS),heated-treated atdifferent conditions,were systematically studied in terms of X-ray patterns and TEM observa-tions.The basic characterizations of the structure and the bond for NANO-SNS were re-vealed.T
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Received: 25 December 1992
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1 Zhang L D,et al.Submitted to J Non-Crystalline Solids(accepted)
2 Birringer R,Gleiter H,Klein H P et al.Phys Lett,1984;102A:365
3 Aiyama T,Fukunage T,Niihara K et al.J Non-crystalline Solids,1979;33:131
4 Yin Z,smith F W.J Non-crystalline Solids,1989:114:489 |
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