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| MACHANISM OF SIZE EFFECT OF ELECTRIC CONDUCTIVITY IN ULTRATHIN METAL FILM |
| TANG zhaolin; HUANG Rongfang; WEN Lishi (Institute of Metal Research; Chinese Academy of Sciences) |
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Cite this article:
TANG zhaolin; HUANG Rongfang; WEN Lishi (Institute of Metal Research; Chinese Academy of Sciences). MACHANISM OF SIZE EFFECT OF ELECTRIC CONDUCTIVITY IN ULTRATHIN METAL FILM. Chin J Mater Res, 1997, 11(4): 438-440.
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Abstract The experimental results showed that the ultrathin Al films possessed decreasing grain size and increasing electric resistivity with decreasing film thickness (size effect). Based on F-S Model, M-S Model and Matthiessen rule, the effect of surface scatter
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Received: 25 August 1997
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