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CdTe介质膜与HgCdTe晶片间界面特性的研究 |
周咏东(1); 赵军(2); 李言谨(2); 方家熊(2) |
1.苏州大学; 2. 中国科学院上海技术物理研究所 |
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引用本文:
周咏东; 赵军; 李言谨; 方家熊 . CdTe介质膜与HgCdTe晶片间界面特性的研究[J]. 材料研究学报, 2000, 14(2): 221-224.
1 D.L.Smith, D.K.Arch, R.A.Wood, M.W.Scott, Appl.Phys.Lett., 45(1), 83(1984) 2 C.T.Elliott, D.Day, D.J.Wilson, Infrared Phys., 22(1), 31(1982) 3 G.N.Pultz, P.W.Norton, E.E.Krueger, M.B.Reine, J.Vac.Sci.Technol.B, 9(5), 1724(1991) 4 L.O.Bubulac, C.R.Viswanathan, J.Cryst.Growth, 123(2), 555(1992) 5 Paul R. Norton, Optical Engineering, 3O(11), 1649(1991) 6 PETER Capper, Properties of Narrow Gap Cadmium-based Compounds, edited by Peter Capper (London,the Institution of Electrical Engineers, INSPEC publication, 1994) p.248 7赵军,碲镉汞新型钝化膜-碲化镉,博士学位论文,中国科学院上海技物所(1996) 8 Y.Nemirovsky, G.Bahir, J.Vac.Sci.Technol.A, 7(2), 450(1989) 9龚海梅,碲镉汞表面与界面,博士学位论文,中国科学院上海技物所(1993) 10 V.C.Lopes, Proc.1992 Meeting of the IRIS Specialty Group on Infrared Materials, edited by Ann Arbor(Moffett Field, CA, MI: Infrared information Analysis Center, 1992) p.213 11 D.E.Lackison, Semicond. Sci. Technol., 2(1), 33(1987) |
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