制备工艺参数对磁控溅射Ni5Pt薄膜的影响
张铭原, 闻明, 李思勰, 张滨, 张广平

Effect of Processing Parameters on Magnetron Sputtering Preparation of High-quality Ni5Pt Films for Schottky Diodes
ZHANG Mingyuan, WEN Ming, LI Sixie, ZHANG Bin, ZHANG Guangping
表2 Ni5Pt薄膜发生断裂的临界厚度和临界沉积时间
Table 2 Critical thickness and critical sputtering time for fracture of Ni5Pt films
Substrate conditionsThickness / nmSputtering time / min
Si(100)-RT38.744.37
Si(100)-50 oC39.204.61
Si(100)-100 oC41.544.79
Si(111)-RT36.264.09
Si(111)-50 oC37.424.40
Si(111)-100 oC39.814.59