β-In2Se3 堆垛缺陷的电子显微学研究
Electron Microscopy Study of Stacking Defects in β-In2Se3
β-In2Se3 堆垛缺陷的电子显微学研究 |
| 王强, 朱鹤雨, 刘志博, 朱毅, 刘培涛, 任文才 |
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Electron Microscopy Study of Stacking Defects in β-In2Se3 |
| WANG Qiang, ZHU Heyu, LIU Zhibo, ZHU Yi, LIU Peitao, REN Wencai |
| 图3 3R β-In2Se3的堆垛层错结构 |
| Fig.3 Atomic-scale HAADF-STEM image of the 3R β-In2Se3 with a SSF (tISF) denoted by the blue dashed line |
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