Inconel 600合金中不同类型晶界处铬的浓度
郑合凤, 师梦杰, 毛强, 张孟超, 李慧(
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Chromium Concentration Near Grain Boundaries with Various Characters in Inconel Alloy 600
ZHENG Hefeng, SHI Mengjie, MAO Qiang, ZHANG Mengchao, LI Hui()
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图2. 用双束FIB技术制备含有特殊晶界的TEM样品
Fig.2. Preparing of TEM samples using focus ion beam technology. (a) OIM map of sample, (b) the corresponding SEM image of the Σ27 grain boundary indicated by the black circle in figure a, (c) cutting the slice containing this grain boundary, (d) milling to prepare the thin foil TEM sample containing this grain boundary
