氦离子辐照下钨纳米丝的自保护行为
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Self-protection Performance of Nano-fuzz Formed on W-plate Surface Due to He+ Irradiation
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图5. W的质量损失和溅射产额与He+剂量的关系 |
Fig.5. Mass loss (a) and sputtering yields (b) of irradiated W as a function of He ions fluencies |
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