氦离子辐照下钨纳米丝的自保护行为
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Self-protection Performance of Nano-fuzz Formed on W-plate Surface Due to He+ Irradiation
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图4. 用导电原子力显微镜分析辐照温度为1023 K时不同He+剂量辐照后钨表面的形貌和缺陷电流分布图像 |
Fig.4. CAFM analysis the surface topography (left) and the simultaneously measured current images (right) of W irradiated with different He ion fluencies at 1023 K (a) 3.0×1025 ions/m2, (b) 6.0×1025ions/m2,(c) 1.0×1026 ions/m2 |
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