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		氦离子辐照下钨纳米丝的自保护行为
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			Self-protection Performance of Nano-fuzz Formed on W-plate Surface Due to He+ Irradiation
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| 图3. 温度为1373 K时 He+辐照剂量为1.0×1026 ions/m2时钨样品截面的SEM照片和蜂窝层或钨纳米丝层的厚度与辐照剂量的关系 | 
| Fig.3. Typical cross-sectional SEM view (a) of polycrystalline W irradiated at temperature of 1373 K and at He+ fluence of 1.0×1026 ions/m2 and the thickness of cellular or fuzzy layers as a function of He+ fluence (b) | 
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